Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11568926 | Latch circuitry for memory applications | Andy Wangkun Chen, Teresa Louise McLaurin, Frank David Frederick, Yew Keong Chong | 2023-01-31 |
| 11280832 | Memory embedded full scan for latent defects | Andy Wangkun Chen, Frank David Frederick | 2022-03-22 |
| 10847211 | Latch circuitry for memory applications | Andy Wangkun Chen, Teresa Louise McLaurin, Frank David Frederick, Yew Keong Chong | 2020-11-24 |
| 10222418 | Scan cell for dual port memory applications | Yew Keong Chong, Teresa Louise McLaurin, Frank David Frederick, Kartikey Jani | 2019-03-05 |
| 7434119 | Method and apparatus for memory self testing | Frank David Frederick | 2008-10-07 |
| 7308623 | Integrated circuit and method for testing memory on the integrated circuit | Paul Stanley Hughes, Frank David Frederick, Brandon Michael Backlund | 2007-12-11 |
| 7293212 | Memory self-test via a ring bus in a data processing apparatus | Conrado Blasco Allue, Stephen John Hill | 2007-11-06 |
| 7269766 | Method and apparatus for memory self testing | Stephen John Hill, Gerard R. Williams, III | 2007-09-11 |
| 7062689 | Method and apparatus for memory self testing | — | 2006-06-13 |
| 7053675 | Switching between clocks in data processing | Gerard R. Williams, III, Mark Silla | 2006-05-30 |