Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11574097 | Deep learning based identification of difficult to test nodes | Harbinder Sikka, Lijuan Luo, Karthikeyan Natarajan, Manjunatha Gowda, Sandeep Gangundi | 2023-02-07 |
| 11526644 | Controlling test networks of chips using integrated processors | Mahmut Yilmaz, Shantanu Sarangi, Jae Wu | 2022-12-13 |
| 11010516 | Deep learning based identification of difficult to test nodes | Harbinder Sikka, Lijuan Luo, Karthikeyan Natarajan, Manjunatha Gowda, Sandeep Gangundi | 2021-05-18 |
| 10663515 | Method and apparatus to access high volume test data over high speed interfaces | Shantanu Sarangi | 2020-05-26 |