Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11574097 | Deep learning based identification of difficult to test nodes | Kaushik Narayanun, Lijuan Luo, Karthikeyan Natarajan, Manjunatha Gowda, Sandeep Gangundi | 2023-02-07 |
| 11010516 | Deep learning based identification of difficult to test nodes | Kaushik Narayanun, Lijuan Luo, Karthikeyan Natarajan, Manjunatha Gowda, Sandeep Gangundi | 2021-05-18 |
| 10657306 | Deep learning testability analysis with graph convolutional networks | Yuzhe Ma, Haoxing Ren, Brucek Kurdo Khailany, Lijuan Luo, Karthikeyan Natarajan | 2020-05-19 |