Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Deep learning testability analysis with graph convolutional networks

Deep learning testability analysis with graph convolutional networks

US Patent 10657306 · Granted May 19, 2020

Estimated economic value: $600,175,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Determining IR drop2025
VLSI placement optimization using self-supervised graph clustering2025
Lithography simulation using a neural network2025
Fine-grained per-vector scaling for neural network quantization2025
Fine-grained per-vector scaling for neural network quantization2025
Optimally clipped tensors and vectors2025
Efficient neural network accelerator dataflows2025
Reducing crosstalk pessimism using GPU-accelerated gate simulation and machine l2025
Reducing crosstalk pessimism using GPU-accelerated gate simulation and machine l2025
Protection of virtual private cloud configurations2025
Rail power density aware standard cell placement for integrated circuits2025
Layout parasitics and device parameter prediction using graph neural networks2025