Issued Patents All Time
Showing 26–44 of 44 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10007386 | Input device and program | Hidekazu Kano, Hiroaki Kitada | 2018-06-26 |
| 9922415 | Inspection method, inspection apparatus, and inspection system | Nobutaka Kikuiri, Hiroteru Akiyama | 2018-03-20 |
| 9891772 | Touch input device and display device | Hiroaki Kitada, Hidekazu Kano | 2018-02-13 |
| 9710905 | Mask inspection apparatus and mask inspection method | — | 2017-07-18 |
| 9690414 | Touch sensor having a pressure detecting sensor with an electrode non-forming section | Hidekazu Kano, Jun Endo, Hiroaki Kitada | 2017-06-27 |
| 9582654 | Mobile device, and authentication program | Hiroaki Kitada, Hidekazu Kano | 2017-02-28 |
| 9575608 | Touch panel | Masamichi Ando | 2017-02-21 |
| 9535682 | Method of determining whether input operation dialogue is displayable and computer system | — | 2017-01-03 |
| 9235883 | Inspection system and method | Nobutaka Kikuiri, Ikunao Isomura | 2016-01-12 |
| 9202270 | Pattern inspection apparatus and pattern inspection method | Hideo Tsuchiya | 2015-12-01 |
| 9165355 | Inspection method | Hideo Tsuchiya, Manabu Isobe, Hiroteru Akiyama, Makoto Yabe, Nobutaka Kikuiri | 2015-10-20 |
| 9057711 | Inspection apparatus and method | Hideo Tsuchiya, Nobutaka Kikuiri | 2015-06-16 |
| 8903158 | Inspection system and inspection method | Hideo Tsuchiya | 2014-12-02 |
| 8861832 | Inspection system and method | Eiji Matsumoto, Nobutaka Kikuiri, Ikunao Isomura | 2014-10-14 |
| 8548223 | Inspection system and method | Hideo Tsuchiya | 2013-10-01 |
| 8213703 | Method and apparatus for reviewing defects on mask | Masanori Sugino | 2012-07-03 |
| 7328372 | Process data collection system which reduces communication load for accessing data | Norikatsu Kataoka, Eiji Katase, Shin-ichirou Mine | 2008-02-05 |
| 6065001 | Information associating apparatus and method | Masaaki Ohkubo, Masayuki Sugizaki, Kazuo Tanaka | 2000-05-16 |
| 5642520 | Method and apparatus for recognizing topic structure of language data | Atsushi Takeshita, Kazuo Tanaka, Toru Nakagawa | 1997-06-24 |