Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11145050 | Pattern inspection apparatus and pattern inspection method | Takafumi Inoue, Kazuhiro Nakashima, Manabu Isobe | 2021-10-12 |
| 10578560 | Inspection apparatus and method for detecting false defects | Ikunao Isomura | 2020-03-03 |
| 10540561 | Inspection method and inspection apparatus | Makoto Yabe, Takafumi Inoue | 2020-01-21 |
| 9922415 | Inspection method, inspection apparatus, and inspection system | Takafumi Inoue, Nobutaka Kikuiri | 2018-03-20 |
| 9165355 | Inspection method | Hideo Tsuchiya, Manabu Isobe, Makoto Yabe, Takafumi Inoue, Nobutaka Kikuiri | 2015-10-20 |
| 8755599 | Review apparatus and inspection system | — | 2014-06-17 |