BS

Bruno Shueler

NI Nova Measuring Instruments: 1 patents #69 of 108Top 65%
Overall (All Time): #2,470,410 of 4,157,543Top 60%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11874237 System and method for measuring a sample by x-ray reflectance scatterometry Heath A. Pois, David A. Reed, Rodney Smedt, Jeffrey T. Fanton 2024-01-16