HO

Hiroshi Ooki

NI Nikon: 16 patents #248 of 2,493Top 10%
HI Hitachi: 1 patents #17,742 of 28,497Top 65%
SC Sanyo Denki Co.: 1 patents #133 of 221Top 65%
SO Sony: 1 patents #17,262 of 25,231Top 70%
Overall (All Time): #237,189 of 4,157,543Top 6%
19
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10578973 Illumination optical assembly, exposure apparatus, and device manufacturing method Hirohisa Tanaka, Shinichi Nakajima 2020-03-03
10222293 Optical characteristic measuring method, optical characteristic adjusting method, exposure apparatus, exposing method, and exposure apparatus manufacturing method by detecting a light amount of measuring light Ayako Nakamura 2019-03-05
9880765 Copy processing management system and copy processing management method Atsushi Sakai, Shingo Maeda 2018-01-30
9513560 Illumination optical assembly, exposure apparatus, and device manufacturing method Hirohisa Tanaka, Shinichi Nakajima 2016-12-06
8081378 Microscope Hisao Osawa, Yumiko Ouchi, Yasuo Yonezawa 2011-12-20
6693704 Wave surface aberration measurement device, wave surface aberration measurement method, and projection lens fabricated by the device and the method Tomoya Noda 2004-02-17
6583928 Microscope Yuji Kadomatsu, Katsumi Ogino 2003-06-24
6500511 Optical disc recycling method and recycled optical disc Toshiyuki Kashiwagi 2002-12-31
6400502 Microscope 2002-06-04
6291145 Image formation method with photosensitive material Tadayosi Kokubo, Kazuya Okamoto, Masato Shibuya, Soichi Owa 2001-09-18
6081051 Linear/rotary actuator and winding machine including same Kazuyuki Kitazawa, Yutaka Takeuchi, Shigeto Murata 2000-06-27
5902716 Exposure method and apparatus Soichi Owa, Kazuya Okamoto, Masato Shibuya 1999-05-11
5851707 Microlithography projection-exposure masks, and methods and apparatus employing same Masato Shibuya, Kazuya Okamoto, Soichi Owa 1998-12-22
5847812 Projection exposure system and method Masato Shibuya, Kazuya Okamoto, Soichi Owa 1998-12-08
5764363 Apparatus for observing a surface using polarized light Yutaka Iwasaki, Jun Iwasaki, Tsuneyuki Hagiwara 1998-06-09
5739898 Exposure method and apparatus Toshihiko Ozawa, Masaya Komatsu, Masato Shibuya, Masaomi Kameyama, Yoshifumi Tokoyoda 1998-04-14
5694220 Minute step measuring method Yutaka Iwasaki, Jun Iwasaki 1997-12-02
5636201 Optical disk memory for recording reproducible information 1997-06-03
5621532 Laser scanning microscope utilizing detection of a far-field diffraction pattern with 2-dimensional detection Tomoya Noda 1997-04-15