Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7523429 | System for designing integrated circuits with enhanced manufacturability | Armen Kroyan, Youping Zhang, Adrianus Ligtenberg | 2009-04-21 |
| 6974653 | Methods for critical dimension and focus mapping using critical dimension test marks | Frank C. Leung, Christopher Howard Putnam, Holly H. Magoon, Ronald A. Pierce, Norman E. Roberts | 2005-12-13 |
| 5835227 | Method and apparatus for determining performance characteristics in lithographic tools | Ilya Grodnensky, Kyoichi Suwa, Shigeru Hirukawa | 1998-11-10 |