| 9283812 |
Pneumatic radial tire for heavy loads |
— |
2016-03-15 |
| 7594644 |
Semiconductor device and method for manufacturing the same, circuit board, electronic apparatus, and semiconductor device manufacturing apparatus |
Takao Yamazaki, Ichiro Hazeyama, Sakae Kitajo, Masahiro Kubo, Yoshimichi Sogawa +1 more |
2009-09-29 |
| 7434190 |
Analysis method and analysis apparatus of designing transmission lines of an integrated circuit packaging board |
Daisuke Ohshima, Jun Sakai, Mitsuru Furuya |
2008-10-07 |
| 7321166 |
Wiring board having connecting wiring between electrode plane and connecting pad |
Jun Sakai, Kazuhiro Motonaga |
2008-01-22 |
| 6998704 |
Semiconductor device and method for manufacturing the same, circuit board, electronic apparatus, and semiconductor device manufacturing apparatus |
Takao Yamazaki, Ichiro Hazeyama, Sakae Kitajo, Masahiro Kubo, Yoshimichi Sogawa +1 more |
2006-02-14 |
| 6486688 |
Semiconductor device testing apparatus having a contact sheet and probe for testing high frequency characteristics |
Toru Taura, Michinobu Tanioka, Takahiro Kimura, Kouji Matsunaga |
2002-11-26 |
| 6433410 |
Semiconductor device tester and method of testing semiconductor device |
Michinobu Tanioka, Takahiro Kimura, Hiroo Ito, Yoshihito Fukasawa |
2002-08-13 |
| 6400168 |
Method for fabricating probe tip portion composed by coaxial cable |
Kouji Matsunaga, Masao Tanehashi, Toru Taura, Masahiko Nikaidou, Yuuichi Yamagishi +1 more |
2002-06-04 |
| 6310483 |
Longitudinal type high frequency probe for narrow pitched electrodes |
Toru Taura, Masao Tanehashi, Kouji Matsunaga, Yuuichi Yamagishi, Satoshi Hayakawa +1 more |
2001-10-30 |
| 6281691 |
Tip portion structure of high-frequency probe and method for fabrication probe tip portion composed by coaxial cable |
Kouji Matsunaga, Masao Tanehashi, Toru Taura, Masahiko Nikaidou, Yuuichi Yamagishi +1 more |
2001-08-28 |
| 6242930 |
High-frequency probe capable of adjusting characteristic impedance in end part and having the end part detachable |
Kouji Matsunaga, Masao Tanehashi, Toru Taura, Masahiko Nikaidou, Yuuichi Yamagishi +2 more |
2001-06-05 |
| 6229321 |
Process for manufacturing high frequency multichip module enabling independent test of bare chip |
Kouji Matsunaga, Masao Tanehashi, Masahiko Nikaidou, Toru Taura, Yuuichi Yamagishi +1 more |
2001-05-08 |
| 5614944 |
Test method and apparatus of sequentially executing synchronous signal test, dot level test, and gradation test of a video signal generator |
Toru Taura |
1997-03-25 |
