Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9283812 | Pneumatic radial tire for heavy loads | — | 2016-03-15 |
| 7594644 | Semiconductor device and method for manufacturing the same, circuit board, electronic apparatus, and semiconductor device manufacturing apparatus | Takao Yamazaki, Ichiro Hazeyama, Sakae Kitajo, Masahiro Kubo, Yoshimichi Sogawa +1 more | 2009-09-29 |
| 7434190 | Analysis method and analysis apparatus of designing transmission lines of an integrated circuit packaging board | Daisuke Ohshima, Jun Sakai, Mitsuru Furuya | 2008-10-07 |
| 7321166 | Wiring board having connecting wiring between electrode plane and connecting pad | Jun Sakai, Kazuhiro Motonaga | 2008-01-22 |
| 6998704 | Semiconductor device and method for manufacturing the same, circuit board, electronic apparatus, and semiconductor device manufacturing apparatus | Takao Yamazaki, Ichiro Hazeyama, Sakae Kitajo, Masahiro Kubo, Yoshimichi Sogawa +1 more | 2006-02-14 |
| 6486688 | Semiconductor device testing apparatus having a contact sheet and probe for testing high frequency characteristics | Toru Taura, Michinobu Tanioka, Takahiro Kimura, Kouji Matsunaga | 2002-11-26 |
| 6433410 | Semiconductor device tester and method of testing semiconductor device | Michinobu Tanioka, Takahiro Kimura, Hiroo Ito, Yoshihito Fukasawa | 2002-08-13 |
| 6400168 | Method for fabricating probe tip portion composed by coaxial cable | Kouji Matsunaga, Masao Tanehashi, Toru Taura, Masahiko Nikaidou, Yuuichi Yamagishi +1 more | 2002-06-04 |
| 6310483 | Longitudinal type high frequency probe for narrow pitched electrodes | Toru Taura, Masao Tanehashi, Kouji Matsunaga, Yuuichi Yamagishi, Satoshi Hayakawa +1 more | 2001-10-30 |
| 6281691 | Tip portion structure of high-frequency probe and method for fabrication probe tip portion composed by coaxial cable | Kouji Matsunaga, Masao Tanehashi, Toru Taura, Masahiko Nikaidou, Yuuichi Yamagishi +1 more | 2001-08-28 |
| 6242930 | High-frequency probe capable of adjusting characteristic impedance in end part and having the end part detachable | Kouji Matsunaga, Masao Tanehashi, Toru Taura, Masahiko Nikaidou, Yuuichi Yamagishi +2 more | 2001-06-05 |
| 6229321 | Process for manufacturing high frequency multichip module enabling independent test of bare chip | Kouji Matsunaga, Masao Tanehashi, Masahiko Nikaidou, Toru Taura, Yuuichi Yamagishi +1 more | 2001-05-08 |
| 5614944 | Test method and apparatus of sequentially executing synchronous signal test, dot level test, and gradation test of a video signal generator | Toru Taura | 1997-03-25 |