Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9563857 | Multi-objective semiconductor product capacity planning system and method thereof | Jei-Zheng Wu, Jia-Nian ZHENG | 2017-02-07 |
| 9513626 | Method of dispatching semiconductor batch production | Chia-Yu Hsu, Ying-Jen Chen | 2016-12-06 |
| 9082009 | Method of defect image classification through integrating image analysis and data mining | Kuo-Hao Chang, Ying-Jen Chen | 2015-07-14 |
| 8863047 | Photolithography capacity planning system and non-transitory computer readable media thereof | Jei-Zheng Wu | 2014-10-14 |
| 8407631 | Method for enhancing wafer exposure effectiveness and efficiency | Chia-Yu Hsu | 2013-03-26 |
| 8200528 | Factor analysis system and analysis method thereof | Chih-Han Hu | 2012-06-12 |
| 7586609 | Method for analyzing overlay errors | Shun-Li Lin, Chia-Yu Hsu, I-Pien Wu | 2009-09-08 |
| 7353077 | Methods for optimizing die placement | Chih-Wei Lin, Hong-Hsing Chou, Yeh-Jye Wang, Jen-Hsin Wang, Chih-Wei Hsiao | 2008-04-01 |
| 6975974 | Overlay error model, sampling strategy and associated equipment for implementation | Kuo-Hao Chang, Chih-Ping Chen, Shun-Li Lin | 2005-12-13 |
| 6368761 | Procedure of alignment for optimal wafer exposure pattern | Shao-Chung Hsu, Chih-Ping Chen | 2002-04-09 |