Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9082009 | Method of defect image classification through integrating image analysis and data mining | Chen-Fu Chien, Ying-Jen Chen | 2015-07-14 |
| 6975974 | Overlay error model, sampling strategy and associated equipment for implementation | Chen-Fu Chien, Chih-Ping Chen, Shun-Li Lin | 2005-12-13 |