Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6799152 | Critical dimension statistical process control in semiconductor fabrication | Chih-Ping Chen, De Chuan Liu, Jung-Kuei Lu, Cheng-Yi Lin, Ta-Hung Yang +3 more | 2004-09-28 |
| 6368761 | Procedure of alignment for optimal wafer exposure pattern | Chen-Fu Chien, Chih-Ping Chen | 2002-04-09 |