CS

Chiang-Lin Shih

NT Nanya Technology: 42 patents #12 of 775Top 2%
📍 New Taipei, TW: #205 of 10,472 inventorsTop 2%
Overall (All Time): #71,421 of 4,157,543Top 2%
42
Patents All Time

Issued Patents All Time

Showing 26–42 of 42 patents

Patent #TitleCo-InventorsDate
10811382 Method of manufacturing semiconductor device Pei-Jhen Wu, Hsih-Yang Chiu, Ching-Hung Chang, Yi-Jen Lo 2020-10-20
10734338 Bonding pad, semiconductor structure, and method of manufacturing semiconductor structure Pei-Jhen Wu, Hsih-Yang Chiu 2020-08-04
10522556 Antifuse structure Chin-Ling Huang, Zi-Yin Chen 2019-12-31
10332749 Method for preparing a semiconductor pattern having semiconductor structure of different lengths Shing-Yih Shih 2019-06-25
10262862 Method of forming fine interconnection for semiconductor devices Shing-Yih Shih 2019-04-16
10204783 Method of forming fine island patterns of semiconductor devices Shing-Yih Shih 2019-02-12
10170328 Semiconductor pattern having semiconductor structures of different lengths Shing-Yih Shih 2019-01-01
10115594 Method of forming fine island patterns of semiconductor devices Shing-Yih Shih, Chih-Ching Lin 2018-10-30
10090154 Method for preparing a semiconductor structure having second line patterns and third line patterns formed over first line patterns Jeng-Ping Lin, Shing-Yih Shih 2018-10-02
9530663 Method for forming a pattern Shu-Hao Hsu, Ya-Chih Wang 2016-12-27
8658051 Lithography resolution improving method Kuo-Yao Cho, Wen-Bin Wu, Ya-Chih Wang, Chao-Wen Lay, CHIH-HUANG WU 2014-02-25
7998660 Exposure method Kuo-Yao Cho 2011-08-16
7915133 Method of forming a trench capacitor Kuo-Yao Cho, Wen-Bin Wu, Jen-Jui Huang 2011-03-29
7892712 Exposure method Feng Chen, Kuo-Yao Cho 2011-02-22
7723181 Overlay alignment mark and alignment method for the fabrication of trench-capacitor dram devices An-Hsiung Liu, Wen-Bin Wu, Hui-Min Mao, Lin-Chin Su, Pei-Ing Lee 2010-05-25
7419882 Alignment mark and alignment method for the fabrication of trench-capacitor dram devices Yuan-Hsun Wu, An-Hsiung Liu, Pei-Ing Lee, Hui-Min Mao, Lin-Chin Su 2008-09-02
6979638 Conducting wire and contact opening forming method for reducing photoresist thickness and via resistance Tse-Yao Huang, Yi-Nan Chen 2005-12-27