Issued Patents All Time
Showing 51–75 of 101 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11574413 | Deep photometric learning (DPL) systems, apparatus and methods | Vadim Pinskiy, Tanaporn Na Narong, Denis Sharoukhov, Tonislav Ivanov | 2023-02-07 |
| 11561383 | Unique oblique lighting technique using a brightfield darkfield objective and imaging method relating thereto | John B. Putman, Julie Orlando, Jospeh G. Bulman | 2023-01-24 |
| 11520133 | Systems, devices and methods for automatic microscope focus | John B. Putman, Vadim Pinskiy, Denis Sharoukhov | 2022-12-06 |
| 11416711 | Defect detection system | Tonislav Ivanov, Denis Babeshko, Vadim Pinskiy, Andrew Sundstrom | 2022-08-16 |
| 11408829 | Macro inspection systems, apparatus and methods | John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola +1 more | 2022-08-09 |
| 11409367 | Apparatus and method for manipulating objects with gesture controls | John B. Putman, Paul Roossin | 2022-08-09 |
| 11411293 | Fault protected signal splitter apparatus | John B. Putman, Damas Limoge, Michael Moskie, Jonathan Lee | 2022-08-09 |
| 11341617 | System, method and apparatus for macroscopic inspection of reflective specimens | John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola +1 more | 2022-05-24 |
| 11333876 | Method and system for mapping objects on unknown specimens | John B. Putman, John Cruickshank, Julie Orlando, Adele Frankel, Brandon Scott | 2022-05-17 |
| 11294146 | Systems, devices, and methods for automatic microscopic focus | John B. Putman, Julie Orlando, Dylan Fashbaugh | 2022-04-05 |
| 11294162 | Fluorescence microscopy inspection systems, apparatus and methods with darkfield channel | John B. Putman, Vadim Pinskiy, Denis Sharoukhov | 2022-04-05 |
| 11209795 | Assembly error correction for assembly lines | Vadim Pinskiy, Eun-Sol Kim, Andrew Sundstrom | 2021-12-28 |
| 11156992 | Predictive process control for a manufacturing process | John B. Putman, Vadim Pinskiy, Damas Limoge | 2021-10-26 |
| 11156982 | Dynamic training for assembly lines | Vadim Pinskiy, Eun-Sol Kim, Andrew Sundstrom | 2021-10-26 |
| 11156991 | Predictive process control for a manufacturing process | John B. Putman, Vadim Pinskiy, Damas Limoge | 2021-10-26 |
| 11117328 | Systems, methods, and media for manufacturing processes | Fabian Hough, John B. Putman, Vadim Pinskiy, Damas Limoge, Aswin Raghav Nirmaleswaran +1 more | 2021-09-14 |
| 11100221 | Dynamic monitoring and securing of factory processes, equipment and automated systems | John B. Putman, Vadim Pinskiy, Damas Limoge, Andrew Sundstrom, James Williams, III | 2021-08-24 |
| 11097490 | Systems, methods, and media for artificial intelligence feedback control in additive manufacturing | Vadim Pinskiy, James Williams, III, Damas Limoge, Aswin Raghav Nirmaleswaran, Mario Chris | 2021-08-24 |
| 11099368 | Camera and specimen alignment to facilitate large area imaging in microscopy | John B. Putman, Brandon Scott, Dylan Fashbaugh | 2021-08-24 |
| 11084225 | Systems, methods, and media for artificial intelligence process control in additive manufacturing | Vadim Pinskiy, Damas Limoge, Aswin Raghav Nirmaleswaran | 2021-08-10 |
| 11086988 | Method, systems and apparatus for intelligently emulating factory control systems and simulating response data | John B. Putman, Vadim Pinskiy, Andrew Sundstrom, James Williams, III | 2021-08-10 |
| 11063965 | Dynamic monitoring and securing of factory processes, equipment and automated systems | John B. Putman, Vadim Pinskiy, Damas Limoge, Andrew Sundstrom, James Williams, III | 2021-07-13 |
| 10970831 | Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imaging | John B. Putman, Vadim Pinskiy, Joseph Succar | 2021-04-06 |
| 10955651 | Unique oblique lighting technique using a brightfield darkfield objective and imaging method relating thereto | John B. Putman, Julie Orlando, Jospeh G. Bulman | 2021-03-23 |
| 10915992 | System, method and apparatus for macroscopic inspection of reflective specimens | John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola +1 more | 2021-02-09 |