Issued Patents All Time
Showing 76–100 of 101 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10914686 | Macro inspection systems, apparatus and methods | John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola +1 more | 2021-02-09 |
| 10901521 | Apparatus and method for manipulating objects with gesture controls | John B. Putman, Paul Roossin | 2021-01-26 |
| 10809516 | Method and system for automatically mapping fluid objects on a substrate | John B. Putman, John Cruickshank, Julie Orlando, Adele Frankel, Brandon Scott | 2020-10-20 |
| 10789695 | Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imaging | John B. Putman, Vadim Pinskiy, Joseph Succar | 2020-09-29 |
| 10698191 | Camera and specimen alignment to facilitate large area imaging in microscopy | John B. Putman, Brandon Scott, Dylan Fashbaugh | 2020-06-30 |
| 10691215 | Apparatus and method for manipulating objects with gesture controls | John B. Putman, Paul Roossin | 2020-06-23 |
| 10670850 | Systems, devices and methods for automatic microscope focus | John B. Putman, Vadim Pinskiy, Denis Sharoukhov | 2020-06-02 |
| 10578850 | Fluorescence microscopy inspection systems, apparatus and methods | John B. Putman, Vadim Pinskiy, Denis Sharoukhov | 2020-03-03 |
| 10545096 | Marco inspection systems, apparatus and methods | John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola +1 more | 2020-01-28 |
| 10518480 | Systems, methods, and media for artificial intelligence feedback control in additive manufacturing | Vadim Pinskiy, James Williams, III, Damas Limoge, Aswin Raghav Nirmaleswaran, Mario Chris | 2019-12-31 |
| 10509199 | Systems, devices and methods for automatic microscopic focus | John B. Putman, Julie Orlando, Dylan Fashbaugh | 2019-12-17 |
| 10502944 | Apparatus and method to reduce vignetting in microscopic imaging | John B. Putman, Dylan Fashbaugh, Roarke Horstmeyer | 2019-12-10 |
| 10481579 | Dynamic training for assembly lines | Vadim Pinskiy, Eun-Sol Kim, Andrew Sundstrom | 2019-11-19 |
| 10481379 | Method and system for automatically mapping fluid objects on a substrate | John B. Putman, John Cruickshank, Julie Orlando, Adele Frankel, Brandon Scott | 2019-11-19 |
| 10467740 | Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imaging | John B. Putman, Vadim Pinskiy, Joseph Succar | 2019-11-05 |
| 10437034 | Unique oblique lighting technique using a brightfield darkfield objective and imaging method relating thereto | John B. Putman, Julie Orlando, Joseph G. Bulman | 2019-10-08 |
| 10416426 | Camera and specimen alignment to facilitate large area imaging in microscopy | John B. Putman, Brandon Scott, Dylan Fashbaugh | 2019-09-17 |
| 10247910 | Systems, devices and methods for automatic microscopic focus | John B. Putman, Julie Orlando, Dylan Fashbaugh | 2019-04-02 |
| 10169852 | Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imaging | John B. Putman, Vadim Pinskiy, Joseph Succar | 2019-01-01 |
| 10146041 | Systems, devices and methods for automatic microscope focus | John B. Putman, Vadim Pinskiy, Denis Sharoukhov | 2018-12-04 |
| 10048477 | Camera and specimen alignment to facilitate large area imaging in microscopy | John B. Putman, Brandon Scott, Dylan Fashbaugh | 2018-08-14 |
| 9561566 | Continuously scanning XY translation stage | John B. Putman | 2017-02-07 |
| 9488819 | Automatic microscopic focus system and method for analysis of transparent or low contrast specimens | John B. Putman, Jeffrey S. Archer, Julie Orlando | 2016-11-08 |
| 7991245 | Increasing image resolution method employing known background and specimen | John B. Putman | 2011-08-02 |
| 6829951 | Process for the physical testing of rubber | John B. Putman | 2004-12-14 |