Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11995802 | System, method and apparatus for macroscopic inspection of reflective specimens | Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen +1 more | 2024-05-28 |
| 11663703 | System, method and apparatus for macroscopic inspection of reflective specimens | Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen +1 more | 2023-05-30 |
| 11656184 | Macro inspection systems, apparatus and methods | Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen +1 more | 2023-05-23 |
| 11408829 | Macro inspection systems, apparatus and methods | Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen +1 more | 2022-08-09 |
| 11341617 | System, method and apparatus for macroscopic inspection of reflective specimens | Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen +1 more | 2022-05-24 |
| 11125677 | Systems, devices, and methods for combined wafer and photomask inspection | Randolph E. Griffith, Jeff Andresen, Michael Moskie, Steve Scranton, Alejandro S. Jaime +1 more | 2021-09-21 |
| 10914686 | Macro inspection systems, apparatus and methods | Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen +1 more | 2021-02-09 |
| 10915992 | System, method and apparatus for macroscopic inspection of reflective specimens | Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen +1 more | 2021-02-09 |
| 10545096 | Marco inspection systems, apparatus and methods | Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen +1 more | 2020-01-28 |
| 10254214 | Systems, devices, and methods for combined wafer and photomask inspection | Randolph E. Griffith, Jeff Andresen, Michael Moskie, Steve Scranton, Alejandro S. Jaime +1 more | 2019-04-09 |