Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11125677 | Systems, devices, and methods for combined wafer and photomask inspection | Jeff Andresen, Scott Pozzi-Loyola, Michael Moskie, Steve Scranton, Alejandro S. Jaime +1 more | 2021-09-21 |
| 10254214 | Systems, devices, and methods for combined wafer and photomask inspection | Jeff Andresen, Scott Pozzi-Loyola, Michael Moskie, Steve Scranton, Alejandro S. Jaime +1 more | 2019-04-09 |