Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11125677 | Systems, devices, and methods for combined wafer and photomask inspection | Randolph E. Griffith, Jeff Andresen, Scott Pozzi-Loyola, Michael Moskie, Steve Scranton +1 more | 2021-09-21 |
| 10254214 | Systems, devices, and methods for combined wafer and photomask inspection | Randolph E. Griffith, Jeff Andresen, Scott Pozzi-Loyola, Michael Moskie, Steve Scranton +1 more | 2019-04-09 |
| 7036985 | X-ray positioning device | Carlos G. Puente | 2006-05-02 |