JA

Jeffrey Andresen

NI Nanotronics Imaging: 8 patents #15 of 43Top 35%
📍 Gilroy, CA: #125 of 527 inventorsTop 25%
🗺 California: #73,997 of 386,348 inventorsTop 20%
Overall (All Time): #612,966 of 4,157,543Top 15%
8
Patents All Time

Issued Patents All Time

Showing 1–8 of 8 patents

Patent #TitleCo-InventorsDate
11995802 System, method and apparatus for macroscopic inspection of reflective specimens Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Scott Pozzi-Loyola +1 more 2024-05-28
11663703 System, method and apparatus for macroscopic inspection of reflective specimens Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Scott Pozzi-Loyola +1 more 2023-05-30
11656184 Macro inspection systems, apparatus and methods Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Scott Pozzi-Loyola +1 more 2023-05-23
11408829 Macro inspection systems, apparatus and methods Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Scott Pozzi-Loyola +1 more 2022-08-09
11341617 System, method and apparatus for macroscopic inspection of reflective specimens Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Scott Pozzi-Loyola +1 more 2022-05-24
10914686 Macro inspection systems, apparatus and methods Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Scott Pozzi-Loyola +1 more 2021-02-09
10915992 System, method and apparatus for macroscopic inspection of reflective specimens Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Scott Pozzi-Loyola +1 more 2021-02-09
10545096 Marco inspection systems, apparatus and methods Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Scott Pozzi-Loyola +1 more 2020-01-28