DB

Denis Babeshko

NI Nanotronics Imaging: 2 patents #26 of 43Top 65%
Overall (All Time): #1,691,197 of 4,157,543Top 45%
2
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12205360 Defect detection system Tonislav Ivanov, Vadim Pinskiy, Matthew C. Putman, Andrew Sundstrom 2025-01-21
11416711 Defect detection system Tonislav Ivanov, Vadim Pinskiy, Matthew C. Putman, Andrew Sundstrom 2022-08-16