Issued Patents All Time
Showing 26–31 of 31 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5717700 | Method for creating a high speed scan-interconnected set of flip-flop elements in an integrated circuit to enable faster scan-based testing | Bernard J. Pappert, Matthew D. Pressly | 1998-02-10 |
| 5617531 | Data Processor having a built-in internal self test controller for testing a plurality of memories internal to the data processor | Matthew D. Pressly, James G. Gay, Clark Gilson Shepard, Pamela S. Laakso | 1997-04-01 |
| 5592493 | Serial scan chain architecture for a data processing system and method of operation | Matthew D. Pressly, Joseph C. Circello, Richard Duerden | 1997-01-07 |
| 5561614 | Method and apparatus for testing pin isolation for an integrated circuit in a low power mode of operation | Juan Guillermo Revilla | 1996-10-01 |
| 5553236 | Method and apparatus for testing a clock stopping/starting function of a low power mode in a data processor | Juan Guillermo Revilla | 1996-09-03 |
| 5383143 | Self re-seeding linear feedback shift register (LFSR) data processing system for generating a pseudo-random test bit stream and method of operation | Matthew D. Pressly | 1995-01-17 |