Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5995731 | Multiple BIST controllers for testing multiple embedded memory arrays | Alfred L. Crouch, Jennifer L. McKeown | 1999-11-30 |
| 5929650 | Method and apparatus for performing operative testing on an integrated circuit | Bernard J. Pappert, Alfred L. Crouch, Robert M. Ash | 1999-07-27 |
| 5812561 | Scan based testing of an integrated circuit for compliance with timing specifications | Grady L. Giles, Alfred L. Crouch, Odis Dale Amason, Jr., Matthew D. Pressly, Michael Alan Mateja +3 more | 1998-09-22 |
| 5617531 | Data Processor having a built-in internal self test controller for testing a plurality of memories internal to the data processor | Alfred L. Crouch, Matthew D. Pressly, James G. Gay, Pamela S. Laakso | 1997-04-01 |