Issued Patents All Time
Showing 276–294 of 294 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5687123 | Semiconductor memory device | Hideto Hidaka, Mikio Asakura, Kazuyasu Fujishima, Kazutami Arimoto, Shigeki Tomishima +1 more | 1997-11-11 |
| 5656853 | Semiconductor device and manufacturing method thereof | — | 1997-08-12 |
| 5644250 | Structure for externally identifying an internal state of a semiconductor device | — | 1997-07-01 |
| 5537361 | Semiconductor memory device and memory access system using a four-state address signal | — | 1996-07-16 |
| 5517459 | Semiconductor memory device in which data are read and written asynchronously with application of address signal | — | 1996-05-14 |
| 5504713 | Semiconductor memory device with redundancy circuit | Yoshio Matsuda, Kazutami Arimoto, Masaki Tsukude, Kazuyasu Fujishima | 1996-04-02 |
| 5477498 | Semiconductor memory device | — | 1995-12-19 |
| 5412605 | Semiconductor memory device | — | 1995-05-02 |
| 5355348 | Semiconductor memory device and memory access system using a four-state address signal | — | 1994-10-11 |
| 5315548 | Column selecting circuit in semiconductor memory device | Kazutami Arimoto, Hideto Hidaka, Masanori Hayashikoshi, Shinji Kawai, Mikio Asakura +4 more | 1994-05-24 |
| 5289417 | Semiconductor memory device with redundancy circuit | Yoshio Matsuda, Kazutami Arimoto, Masaki Tsukude, Kazuyasu Fujishima | 1994-02-22 |
| 5267214 | Shared-sense amplifier control signal generating circuit in dynamic type semiconductor memory device and operating method therefor | Kazuyasu Fujishima, Yoshio Matsuda, Kazutami Arimoto, Masaki Tsukude | 1993-11-30 |
| 5249155 | Semiconductor device incorporating internal voltage down converting circuit | Kazutami Arimoto, Hideto Hidaka, Mikio Asakura, Masanori Hayashikoshi, Masaki Tsukude +1 more | 1993-09-28 |
| 5185744 | Semiconductor memory device with test circuit | Kazutami Arimoto, Kazuyasu Fujishima, Yoshio Matsuda, Masaki Tsukude | 1993-02-09 |
| 5184327 | Semiconductor memory device having on-chip test circuit and method for testing the same | Yoshio Matsuda, Kazutami Arimoto, Masaki Tsukude, Kazuyasu Fujishima | 1993-02-02 |
| 5088063 | Semiconductor memory device having on-chip test circuit | Yoshio Matsuda, Kazutami Arimoto, Masaki Tsukude, Kazuyasu Fujishima | 1992-02-11 |
| 5060230 | On chip semiconductor memory arbitrary pattern, parallel test apparatus and method | Kazutami Arimoto, Kazuyasu Fujishima, Yoshio Matsuda, Masaki Tsukude | 1991-10-22 |
| 5022007 | Test signal generator for semiconductor integrated circuit memory and testing method thereof | Kazutami Arimoto, Yoshio Matsuda, Masaki Tsukude, Kazuyasu Fujishima | 1991-06-04 |
| 4977542 | Dynamic semiconductor memory device of a twisted bit line system having improved reliability of readout | Yoshio Matsuda, Kazuyasu Fujishima, Kazutami Arimoto, Masaki Tsukude | 1990-12-11 |