TH

Takeshi Hamamoto

Mitsubishi Electric: 42 patents #211 of 25,717Top 1%
KT Kabushiki Kaisha Toshiba: 34 patents #675 of 21,451Top 4%
RT Renesas Technology: 17 patents #86 of 3,337Top 3%
NE Nec: 3 patents #4,195 of 14,502Top 30%
NE Nec Electronics: 3 patents #234 of 1,789Top 15%
SU Sumco: 2 patents #160 of 464Top 35%
UN Unknown: 1 patents #29,356 of 83,584Top 40%
MD Mitsubisih Denki: 1 patents #26 of 381Top 7%
Nissan Motor Co.: 1 patents #4,519 of 8,689Top 55%
ND Nitto Denko: 1 patents #1,580 of 2,479Top 65%
Toshiba Memory: 1 patents #1,210 of 1,971Top 65%
📍 Yokkaichi, JP: #6 of 2,072 inventorsTop 1%
Overall (All Time): #12,720 of 4,157,543Top 1%
107
Patents All Time

Issued Patents All Time

Showing 26–50 of 107 patents

Patent #TitleCo-InventorsDate
7058923 OPTICAL PROXIMITY EFFECT CORRECTING METHOD AND MASK DATA FORMING METHOD IN SEMICONDUCTOR MANUFACTURING PROCESS, WHICH CAN SUFFICIENTLY CORRECT OPTICAL PROXIMITY EFFECT, EVEN UNDER VARIOUS SITUATIONS WITH REGARD TO SIZE AND SHAPE OF DESIGN PATTERN, AND SPACE WIDTH AND POSITION RELATION BETWEEN DESIGN PATTERNS Keiichiro Tounai 2006-06-06
7049661 Semiconductor device having epitaxial layer Takashi Yamada, Hajime Nagano 2006-05-23
7030437 Semiconductor device having sense amplifier including paired transistors Satoshi Yodogawa, Satoshi Kawasaki 2006-04-18
7032066 Semiconductor memory unit Takeo Miki, Mikio Asakura 2006-04-18
7023198 Semiconductor device and method of inspecting the same Takeo Miki 2006-04-04
6937088 Potential generating circuit capable of correctly controlling output potential Katsuyoshi Mitsui 2005-08-30
6903976 Semiconductor memory device reduced in power consumption during burn-in test Tomoya Kawagoe 2005-06-07
6894940 Semiconductor memory device having a sub-amplifier configuration Takashi Kono 2005-05-17
6850454 Semiconductor memory device with reduced current consumption during standby state Shigehiro Kuge 2005-02-01
6833723 Semiconductor device with phase comparator comparing phases between internal signal and external signal Takeo Miki 2004-12-21
6809336 Semiconductor device comprising sense amplifier and manufacturing method thereof Tatsuya Kunikiyo, Yoshinori Tanaka 2004-10-26
6804154 Semiconductor memory device including power generation circuit implementing stable operation Makoto Kitagawa 2004-10-12
6782498 Semiconductor memory device allowing mounting of built-in self test circuit without addition of interface specification Tetsushi Tanizaki 2004-08-24
6781900 Semiconductor memory device with enhanced reliability Kiyohiro Furutani, Takashi Kubo, Shigehiro Kuge 2004-08-24
6781443 Potential generating circuit capable of correctly controlling output potential Katsuyoshi Mitsui 2004-08-24
6777920 Internal power-supply potential generating circuit Kiyohiro Furutani, Susumu Tanida 2004-08-17
6757212 Clock synchronous type semiconductor memory device Takeo Miki 2004-06-29
6733932 Mask lithography data generation method Youji Tonooka 2004-05-11
6603817 Buffer circuit capable of correctly transferring small amplitude signal in synchronization with high speed clock signal Zenya Kawaguchi 2003-08-05
6597625 Semiconductor memory device Takanobu Suzuki 2003-07-22
6570174 OPTICAL PROXIMITY EFFECT CORRECTING METHOD IN SEMICONDUCTOR MANUFACTURING PROCESS, WHICH CAN SUFFICIENTLY CORRECT OPTICAL PROXIMITY EFFECT, EVEN UNDER VARIOUS SITUATIONS WITH REGARD TO SIZE AND SHAPE OF DESIGN PATTERN, AND SPACE WIDTH AND POSITION RELATION BETWEEN DESIGN PATTERNS Keiichiro Tounai 2003-05-27
6567324 Semiconductor memory device with reduced number of redundant program sets Tsukasa Ooishi 2003-05-20
6542422 Semiconductor memory device performing high speed coincidence comparison operation with defective memory cell address Kiyohiro Furutani, Takashi Kubo 2003-04-01
6521938 Dynamic-type semiconductor memory device 2003-02-18
6505325 Pattern data density inspection apparatus and density inspection method and recording medium storing pattern data density inspection program 2003-01-07