TG

Thomas M. Graettinger

Micron: 76 patents #203 of 6,345Top 4%
IN Intel: 2 patents #13,213 of 30,777Top 45%
📍 Boise, ID: #106 of 3,546 inventorsTop 3%
🗺 Idaho: #145 of 8,810 inventorsTop 2%
Overall (All Time): #23,706 of 4,157,543Top 1%
78
Patents All Time

Issued Patents All Time

Showing 51–75 of 78 patents

Patent #TitleCo-InventorsDate
6964901 Methods of forming rugged electrically conductive surfaces and layers Marsela Pontoh, Cem Basceri 2005-11-15
6960513 Capacitor having an electrode formed from a transition metal or a conductive metal-oxide, and method of forming same F. Daniel Gealy 2005-11-01
6919257 Method of forming a capacitor F. Daniel Gealy 2005-07-19
6881642 Method of forming a MIM capacitor with metal nitride electrode Cem Basceri 2005-04-19
6858894 Comprising agglomerates of one or more noble metals Cancheepuram V. Srividya, F. Daniel Gealy 2005-02-22
6812112 Methods for forming and integrated circuit structures containing enhanced-surface-area conductive layers Cem Basceri, Mark Visokay, Steven D. Cummings 2004-11-02
6806187 Electrical contact for high dielectric constant capacitors and method for fabricating the same F. Daniel Gealy 2004-10-19
6773984 Methods of depositing noble metals and methods of forming capacitor constructions Cancheepuram V. Srividya, F. Daniel Gealy 2004-08-10
6764943 Methods for forming and integrated circuit structures containing enhanced-surface-area conductive layers Cem Basceri, Mark Visokay, Steven D. Cummings 2004-07-20
6753618 MIM capacitor with metal nitride electrode materials and method of formation Cem Basceri 2004-06-22
6696718 Capacitor having an electrode formed from a transition metal or a conductive metal-oxide, and method of forming same F. Daniel Gealy 2004-02-24
6689657 Method of forming a capacitor F. Daniel Gealy 2004-02-10
6682969 Top electrode in a strongly oxidizing environment Cem Basceri, Howard E. Rhodes, Gurtej S. Sandhu, F. Daniel Gealy 2004-01-27
6580114 Processing methods of forming a capacitor, and capacitor construction Paul J. Schuele, Pierre C. Fazan, Li Li, Zhiqiang Wu, Kunal R. Parekh +1 more 2003-06-17
6482736 Methods for forming and integrated circuit structures containing enhanced-surface-area conductive layers Cem Basceri, Mark Visokay, Steven D. Cummings 2002-11-19
6348709 Electrical contact for high dielectric constant capacitors and method for fabricating the same F. Daniel Gealy 2002-02-19
6309973 Semiconductor processing methods of forming a conductive projection and methods of increasing alignment tolerances Mark Fischer, John K. Zahurak, Kunal R. Parekh 2001-10-30
6297124 Method of improving alignment signal strength by reducing refraction index at interface of materials in semiconductors Daryl C. New 2001-10-02
6171925 Capacitor, and methods for forming a capacitor Paul J. Schuele, Brent A. McClure 2001-01-09
6146961 Processing methods of forming a capacitor Paul J. Schuele, Pierre C. Fazan, Li Li, Zhiqiang Wu, Kunal R. Parekh +1 more 2000-11-14
6096571 Method of improving alignment signal strength by reducing refraction index at interface of materials in semiconductors Daryl C. New 2000-08-01
6083803 Semiconductor processing methods of forming a conductive projection and methods of increasing alignment tolerances Mark Fischer, John K. Zahurak, Kunal R. Parekh 2000-07-04
6060785 Method of improving alignment signal strength by reducing refraction index at interface of materials in semiconductors Daryl C. New 2000-05-09
6049101 Processing methods of forming a capacitor, and capacitor construction Paul J. Schuele, Pierre C. Fazan, Li Li, Zhiqiang Wu, Kunal R. Parekh +1 more 2000-04-11
5933743 Method of improving alignment signal strength by reducing refraction index at interface of materials in semiconductors Daryl C. New 1999-08-03