SS

Scott E. Smith

Micron: 60 patents #280 of 6,345Top 5%
TI Texas Instruments: 15 patents #889 of 12,488Top 8%
NT Nanya Technology: 2 patents #292 of 775Top 40%
📍 Plano, TX: #44 of 4,842 inventorsTop 1%
🗺 Texas: #711 of 125,132 inventorsTop 1%
Overall (All Time): #22,329 of 4,157,543Top 1%
80
Patents All Time

Issued Patents All Time

Showing 51–75 of 80 patents

Patent #TitleCo-InventorsDate
7613060 Methods, circuits, and systems to select memory regions 2009-11-03
7482855 Circuit and method for stable fuse detection Christian Mohr 2009-01-27
7360006 Apparatus and method for managing voltage buses Duc Ho 2008-04-15
7276955 Circuit and method for stable fuse detection Christian Mohr 2007-10-02
7218568 Circuit and method for operating a delay-lock loop in a power saving manner Tyler Gomm 2007-05-15
7177208 Circuit and method for operating a delay-lock loop in a power saving manner Tyler Gomm 2007-02-13
7145817 Reduced power redundancy address decoder and comparison circuit Christian Mohr 2006-12-05
7123522 Method and apparatus for achieving low power consumption during power down Duc Ho 2006-10-17
7096304 Apparatus and method for managing voltage buses Duc Ho 2006-08-22
6868019 Reduced power redundancy address decoder and comparison circuit Christian Mohr 2005-03-15
6865115 Input stage apparatus and method having a variable reference voltage Kallol Mazumder 2005-03-08
6809970 Input stage apparatus and method having a variable reference voltage Kallol Mazumder 2004-10-26
6737897 Power reduction for delay locked loop circuits Tyler Gomm, Travis E. Dirkes, Ross Dermott, Daniel R. Loughmiller 2004-05-18
6586979 Method for noise and power reduction for digital delay lines Tyler Gomm, Travis E. Dirkes, Ross Dermott, Daniel R. Loughmiller 2003-07-01
6546510 Burn-in mode detect circuit for semiconductor device Kallol Mazumder, Francis Hii 2003-04-08
6529422 Input stage apparatus and method having a variable reference voltage Kallol Mazumder 2003-03-04
6242936 Circuit for driving conductive line and testing conductive line for current leakage Michael Duc Ho, Duy-Loan T. Le 2001-06-05
6201752 Timing circuit for high voltage testing Anh Viet Bui, Duy-Loan T. Le 2001-03-13
6191644 Startup circuit for bandgap reference circuit Bangalore Kodandaram Srinath 2001-02-20
6134168 Circuit and method for internal refresh counter Matthew R. Harrington, Steven C. Eplett, Kallol Mazumder 2000-10-17
6118323 Electrostatic discharge protection circuit and method Michael Chaine, Thuyanh Bui 2000-09-12
6038177 Data pipeline interrupt scheme for preventing data disturbances M. Kumar Rajith, Kallol Mazumder, Duy-Loan T. Le 2000-03-14
5999473 Circuit and method for internal refresh counter Matthew R. Harrington, Steven C. Eplett, Kallol Mazumder 1999-12-07
5867421 Integrated circuit memory device having reduced stress across large on-chip capacitor Michael Duc Ho, Duy-Loan T. Le 1999-02-02
5706234 Testing and repair of wide I/O semiconductor memory devices designed for testing Charles J. Pilch, Jr., Carl Perrin, Duy-Loan T. Le, Yutaka Komai 1998-01-06