Issued Patents All Time
Showing 25 most recent of 43 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12027228 | Temperature differential-based voltage offset control | Ryan G. Fisher, Arvin Daniel A. Daguro, Noel Marquez, Reshmi Basu, Kenneth Koenig | 2024-07-02 |
| 7468623 | Clamp circuit with fuse options | Joseph C. Sher | 2008-12-23 |
| 7254753 | Circuit and method for configuring CAM array margin test and operation | — | 2007-08-07 |
| 7196544 | Communication device for a logic circuit | — | 2007-03-27 |
| 7053650 | Communication device for a logic circuit | — | 2006-05-30 |
| 6946863 | Circuit and method for measuring and forcing an internal voltage of an integrated circuit | Joseph C. Sher, Kevin G. Duesman | 2005-09-20 |
| 6901013 | Controller for delay locked loop circuits | William F. Jones, Wen Li, Mark R. Thomann, Timothy B. Cowles | 2005-05-31 |
| 6885238 | Clamp circuit with fuse options | Joseph C. Sher | 2005-04-26 |
| 6847534 | High density dynamic ternary-CAM memory architecture | — | 2005-01-25 |
| 6836419 | Split word line ternary CAM architecture | — | 2004-12-28 |
| 6836437 | Method of reducing standby current during power down mode | Wen Li, Mark R. Thomann, Scott E. Schaefer | 2004-12-28 |
| 6822475 | Method for contact pad isolation | — | 2004-11-23 |
| 6809974 | Controller for delay locked loop circuits | William F. Jones, Wen Li, Mark R. Thomann, Timothy B. Cowles | 2004-10-26 |
| 6744654 | High density dynamic ternary-CAM memory architecture | — | 2004-06-01 |
| 6737897 | Power reduction for delay locked loop circuits | Tyler Gomm, Travis E. Dirkes, Ross Dermott, Scott E. Smith | 2004-05-18 |
| 6665219 | Method of reducing standby current during power down mode | Wen Li, Mark R. Thomann, Scott E. Schaefer | 2003-12-16 |
| 6628144 | Circuit and method for contact pad isolation | Stephen R. Porter | 2003-09-30 |
| 6586979 | Method for noise and power reduction for digital delay lines | Tyler Gomm, Travis E. Dirkes, Ross Dermott, Scott E. Smith | 2003-07-01 |
| 6564351 | Circuit and method for testing an integrated circuit | — | 2003-05-13 |
| 6448756 | Delay line tap setting override for delay locked loop (DLL) testability | — | 2002-09-10 |
| 6438060 | Method of reducing standby current during power down mode | Wen Li, Mark R. Thomann, Scott E. Schaefer | 2002-08-20 |
| 6396300 | Circuit and method for contact pad isolation | Stephen R. Porter | 2002-05-28 |
| 6377089 | Output driver | — | 2002-04-23 |
| 6351180 | Clamp circuit with fuse options | Joseph C. Sher | 2002-02-26 |
| 6266794 | Circuit and method for testing an integrated circuit | — | 2001-07-24 |