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Scott E. Schaefer — 151 Patents

Micron: 137 patents #89 of 6,374Top 2%
Anheuser-Busch: 1 patents #65 of 146Top 45%
Boise, ID: #33 of 3,546 inventorsTop 1%
Idaho: #47 of 8,810 inventorsTop 1%
Overall (All Time): #6,165 of 4,157,543Top 1%
151 Patents All Time
Scott E. Schaefer has been granted 151 US patents while listed as an inventor at Micron. The first was granted in 1993 and the most recent in November 2025. Scott E. Schaefer ranks #6,165 of 4,157,543 US inventors in our database (top 0.15%). Patent records list Scott E. Schaefer in Boise, ID, US.

Issued Patents All Time

Showing 1–25 of 151 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
12468600 Coordinated error correction Aaron P. Boehm 2025-11-11
12461693 Temperature monitoring for memory devices Aaron P. Boehm, Todd Jackson Plum, Scott D. Van De Graaff, Mark D. Ingram 2025-11-04
12443486 Evaluation of memory device health monitoring logic Aaron P. Boehm, Scott D. Van De Graaff, Mark D. Ingram, Todd Jackson Plum 2025-10-14
12423175 Coordinated error protection Aaron P. Boehm 2025-09-23
12405856 Memory die fault detection using a calibration pin Paul A. LaBerge 2025-09-02
12386699 Techniques for indicating a write link error — 2025-08-12
12374418 Techniques for detecting a state of a bus Aaron P. Boehm 2025-07-29
12373132 Techniques for detecting a state of a bus — 2025-07-29
12367161 Individually addressing memory devices disconnected from a data bus Matthew A. Prather 2025-07-22
12360848 Error correction memory device with fast data access Aaron P. Boehm 2025-07-15
12362031 Indicating a status of a memory built-in self-test for multiple memory device ranks — 2025-07-15
12354691 Indicating valid memory access operations — 2025-07-08
12339740 Methods and devices for error correction Aaron P. Boehm 2025-06-24
12340860 Indicating a status of a memory built-in self-test using a data mask inversion bit — 2025-06-24
12334175 Differential strobe fault indication — 2025-06-17
12321643 Memory command verification Aaron P. Boehm 2025-06-03
12307120 Inter-device communications for memory health monitoring Aaron P. Boehm, Mark D. Ingram, Scott D. Van De Graaff, Todd Jackson Plum 2025-05-20
12306731 Evaluation of memory device health monitoring logic Aaron P. Boehm, Todd Jackson Plum, Mark D. Ingram, Scott D. Van De Graaff 2025-05-20
12299325 Frequency monitoring for memory devices Aaron P. Boehm, Todd Jackson Plum, Scott D. Van De Graaff, Mark D. Ingram 2025-05-13
12287706 Memory device with status feedback for error correction Aaron P. Boehm 2025-04-29
12283333 Bit retiring to mitigate bit errors — 2025-04-22
12243607 Indicating a status of a memory built-in self-test — 2025-03-04
12242343 Command address fault detection using a parity pin Melissa I. Uribe, Aaron P. Boehm, Steffen Buch 2025-03-04
12237844 Error detection and classification at a host device Aaron P. Boehm 2025-02-25
12237031 Refresh rate selection for a memory built-in self-test — 2025-02-25

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