Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6385125 | Synchronous semiconductor integrated circuit device capable of test time reduction | Tsukasa Ooishi, Hiroaki Tanizaki, Shigeki Tomishima | 2002-05-07 |
| 6204548 | Fuse for semiconductor device and semiconductor device | — | 2001-03-20 |
| 6069829 | Internal clock multiplication for test time reduction | Roger D. Norwood, Daniel B. Penny | 2000-05-30 |
| 5706234 | Testing and repair of wide I/O semiconductor memory devices designed for testing | Charles J. Pilch, Jr., Carl Perrin, Duy-Loan T. Le, Scott E. Smith | 1998-01-06 |