FH

Fan Ho

Micron: 29 patents #636 of 6,345Top 15%
RA Rambus: 22 patents #92 of 549Top 20%
IT Inapac Technology: 3 patents #2 of 6Top 35%
PC Powertech Industrial Co.: 1 patents #18 of 34Top 55%
RT Richtek Technology: 1 patents #265 of 459Top 60%
VS Vanguard International Semiconductor: 1 patents #340 of 585Top 60%
📍 San Ramon, CA: #44 of 2,140 inventorsTop 3%
🗺 California: #6,332 of 386,348 inventorsTop 2%
Overall (All Time): #42,399 of 4,157,543Top 2%
57
Patents All Time

Issued Patents All Time

Showing 26–50 of 57 patents

Patent #TitleCo-InventorsDate
7103815 Testing of integrated circuit devices Adrian E. Ong 2006-09-05
6983404 Method and apparatus for checking the resistance of programmable elements Douglas J. Cutter, Adrian E. Ong, Kurt D. Beigel, Brett Debenham, Dien Luong +2 more 2006-01-03
6754866 Testing of integrated circuit devices Adrian E. Ong 2004-06-22
6690611 Cancellation of redundant elements with a cancel bank Douglas J. Cutter, Kurt D. Beigel 2004-02-10
6686790 Low current redundancy anti-fuse method and apparatus Douglas J. Cutter, Kurt D. Beigel 2004-02-03
6657914 Configurable addressing for multiple chips in a package Adrian E. Ong 2003-12-02
6633507 Cancellation of redundant elements with a cancel bank Douglas J. Cutter, Kurt D. Beigel 2003-10-14
6525399 Junctionless antifuses and systems containing junctionless antifuses Douglas J. Cutter, Kurt D. Beigel 2003-02-25
6462608 Low current redundancy anti-fuse apparatus Douglas J. Cutter, Kurt D. Beigel 2002-10-08
6456149 Low current redundancy anti-fuse method and apparatus Douglas J. Cutter, Kurt D. Beigel 2002-09-24
6444558 Methods of forming and programming junctionless antifuses Douglas J. Cutter, Kurt D. Beigel 2002-09-03
6365421 Method and apparatus for storage of test results within an integrated circuit Brett Debenham, Kim Pierce, Douglas J. Cutter, Kurt D. Beigel, Patrick J. Mullarkey +6 more 2002-04-02
6351140 Low current redundancy anti-fuse method and apparatus Douglas J. Cutter, Kurt D. Beigel 2002-02-26
6351424 Cancellation of redundant elements with a cancel bank Douglas J. Cutter, Kurt D. Beigel 2002-02-26
6323536 Method and apparatus for forming a junctionless antifuse Douglas J. Cutter, Kurt D. Beigel 2001-11-27
6255894 Low current redundancy anti-fuse method and apparatus Douglas J. Cutter, Kurt D. Beigel 2001-07-03
6194738 Method and apparatus for storage of test results within an integrated circuit Brett Debenham, Kim Pierce, Douglas J. Cutter, Kurt D. Beigel, Patrick J. Mullarkey +6 more 2001-02-27
6185705 Method and apparatus for checking the resistance of programmable elements Douglas J. Cutter, Adrian E. Ong, Kurt D. Beigel, Brett Debenham, Dien Luong +2 more 2001-02-06
6154398 Low current redundancy anti-fuse method and apparatus Douglas J. Cutter, Kurt D. Beigel 2000-11-28
6154410 Method and apparatus for reducing antifuse programming time Douglas J. Cutter, Kurt D. Beigel, Adrian E. Ong, Patrick J. Mullarkey, Dien Luong +2 more 2000-11-28
6128240 Cancellation of redundant elements with a cancel bank Douglas J. Cutter, Kurt D. Beigel 2000-10-03
6069064 Method for forming a junctionless antifuse Douglas J. Cutter, Kurt D. Beigel 2000-05-30
6023431 Low current redundancy anti-fuse method and apparatus Douglas J. Cutter, Kurt D. Beigel 2000-02-08
5982656 Method and apparatus for checking the resistance of programmable elements Douglas J. Cutter, Kurt D. Beigel, Brett Debenham, Dien Luong, Kim Pierce +1 more 1999-11-09
5973978 Anti-fuse programming path Douglas J. Cutter, Kurt D. Beigel 1999-10-26