Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12340282 | Anomaly detection and resolution | Zahra Hosseinimakarem, Marta Egorova | 2025-06-24 |
| 11995567 | Apparatuses and methods for color matching and recommendations | Yi Hu, Zahra Hosseinimakarem, Jonathan D. Harms | 2024-05-28 |
| 11983619 | Transformer neural network in memory | Jing Gong, Stewart R. Watson, Ameya Parab | 2024-05-14 |
| 11922613 | Apparatuses and methods for determining wafer defects | Yutao Gong, Seth A. Eichmeyer, Jing Gong | 2024-03-05 |
| 11861493 | Machine learning models based on altered data and systems and methods for training and using the same | Zahra Hosseinimakarem, Jonathan D. Harms | 2024-01-02 |
| 11681906 | Bayesian network in memory | Stewart R. Watson, Jing Gong, Ameya Parab | 2023-06-20 |
| 11585654 | Texture detection apparatuses, systems, and methods for analysis | Zahra Hosseinimakarem, Jonathan D. Harms, Alyssa N. Scarbrough, Yi Hu | 2023-02-21 |
| 10146036 | Semiconductor wafer inspection using care area group-specific threshold settings for detecting defects | Parul Dhagat, Ananthan Raghunathan, Vikas Sachan | 2018-12-04 |
| 10042973 | Expansion of allowed design rule space by waiving benign geometries | Ioana Graur | 2018-08-07 |
| 9690898 | Generative learning for realistic and ground rule clean hot spot synthesis | Ioana Graur, Ian P. Stobert | 2017-06-27 |
| 9542740 | Method for detecting defect in pattern | Ki Hyun Kim, Kai-Yuan CHI, Seung-hune Yang | 2017-01-10 |
| 8677288 | Test pattern selection method for OPC model calibration | Seong Ho Moon, Artem Shamsuarov, Seung-hune Yang, Moon-Gyu Jeong | 2014-03-18 |