Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9542740 | Method for detecting defect in pattern | Ki Hyun Kim, Dmitry Vengertsev, Seung-hune Yang | 2017-01-10 |
KC
Kai-Yuan CHI
Overall (All Time): #2,926,333 of 4,157,543Top 75%
1
Patents All Time