Patent Leaderboard
USPTO Patent Rankings Data through Sept 30, 2025
SS

Satish Sadam — 12 Patents

MLMagic Leap: 6 patents #254 of 665Top 40%
MIMolecular Imprints: 5 patents #30 of 97Top 35%
AUAccretech Usa: 1 patents #3 of 15Top 20%
Round Rock, TX: #318 of 1,915 inventorsTop 20%
Texas: #12,559 of 125,132 inventorsTop 15%
Overall (All Time): #392,707 of 4,157,543Top 10%
12 Patents All Time

Issued Patents All Time

Showing 1–12 of 12 patents

Patent #TitleCo-InventorsDate
12204258 Managing multi-objective alignments for imprinting Jeremy Lee Sevier, Joseph Michael Imhof, Kang Luo, Kangkang Wang, Roy Matthew Patterson +5 more 2025-01-21
12083733 Double-sided imprinting Roy Matthew Patterson, Charles Scott Carden, Ryan Christiansen, Matthew S. Shafran, Christopher John Fleckenstein +3 more 2024-09-10
12038591 Polymer patterned disk stack manufacturing Ling Li, Chieh Chang, Sharad D. Bhagat, Christophe Peroz, Brian George Hill +1 more 2024-07-16
11846890 Positioning substrates in imprint lithography processes Roy Matthew Patterson, Charles Scott Carden 2023-12-19
11679533 Methods and apparatuses for casting optical polymer films Jeremy Lee Sevier, Matthew S. Shafran, Roy Matthew Patterson, Kangkang Wang, Chieh Chang +1 more 2023-06-20
11567418 Positioning substrates in imprint lithography processes Roy Matthew Patterson, Charles Scott Carden 2023-01-31
11498261 Double-sided imprinting Roy Matthew Patterson, Charles Scott Carden, Ryan Christiansen, Matthew S. Shafran, Christopher John Fleckenstein +3 more 2022-11-15
10926452 Double-sided imprinting Roy Matthew Patterson, Charles Scott Carden, Ryan Christiansen, Matthew S. Shafran, Christopher John Fleckenstein +3 more 2021-02-23
10928744 Positioning substrates in imprint lithography processes Roy Matthew Patterson, Charles Scott Carden 2021-02-23
10317806 Substrate loading in microlithography Roy Matthew Patterson, Christopher John Fleckenstein, Matthew S. Shafran, Charles Scott Carden, Ryan Christiansen 2019-06-11
10025202 Substrate loading in microlithography Roy Matthew Patterson, Christopher John Fleckenstein, Matthew S. Shafran, Charles Scott Carden, Ryan Christiansen 2018-07-17
7508504 Automatic wafer edge inspection and review system Ju-wha Jin, Vishal Verma, Zhiyan Huang, Siming Lin, Michael Robbins +1 more 2009-03-24