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Shape feature extraction and classification |
Kevin M. Crotty, Nicolas Vazquez |
2010-02-23 |
| 7508504 |
Automatic wafer edge inspection and review system |
Ju-wha Jin, Satish Sadam, Vishal Verma, Zhiyan Huang, Michael Robbins +1 more |
2009-03-24 |
| 7046842 |
System and method for color characterization using fuzzy pixel classification with application in color matching and color match location |
Dinesh Nair, Darren R. Schmidt |
2006-05-16 |
| 7039229 |
Locating regions in a target image using color match, luminance pattern match and hill-climbing techniques |
Dinesh Nair, Darren R. Schmidt |
2006-05-02 |
| 6963425 |
System and method for locating color and pattern match regions in a target image |
Dinesh Nair, Darren R. Schmidt, Nicolas Vazquez |
2005-11-08 |
| 6944331 |
Locating regions in a target image using color matching, luminance pattern matching and hue plane pattern matching |
Darren R. Schmidt, Kevin L. Schultz, Dinesh Nair |
2005-09-13 |
| 6757428 |
System and method for color characterization with applications in color measurement and color matching |
Dinesh Nair |
2004-06-29 |