Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7668376 | Shape feature extraction and classification | Kevin M. Crotty, Nicolas Vazquez | 2010-02-23 |
| 7508504 | Automatic wafer edge inspection and review system | Ju-wha Jin, Satish Sadam, Vishal Verma, Zhiyan Huang, Michael Robbins +1 more | 2009-03-24 |
| 7046842 | System and method for color characterization using fuzzy pixel classification with application in color matching and color match location | Dinesh Nair, Darren R. Schmidt | 2006-05-16 |
| 7039229 | Locating regions in a target image using color match, luminance pattern match and hill-climbing techniques | Dinesh Nair, Darren R. Schmidt | 2006-05-02 |
| 6963425 | System and method for locating color and pattern match regions in a target image | Dinesh Nair, Darren R. Schmidt, Nicolas Vazquez | 2005-11-08 |
| 6944331 | Locating regions in a target image using color matching, luminance pattern matching and hue plane pattern matching | Darren R. Schmidt, Kevin L. Schultz, Dinesh Nair | 2005-09-13 |
| 6757428 | System and method for color characterization with applications in color measurement and color matching | Dinesh Nair | 2004-06-29 |