JG

John Gregory

Lsi Logic: 14 patents #102 of 1,957Top 6%
VM Virco Mfg.: 4 patents #7 of 28Top 25%
OC Olympus Optical Co.: 2 patents #1,178 of 2,334Top 55%
SY Symetrix: 2 patents #35 of 73Top 50%
AM Amazon: 1 patents #10,608 of 19,158Top 60%
Overall (All Time): #161,967 of 4,157,543Top 4%
25
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
D998394 Table Peter Glass, Douglas A. Virtue 2023-09-12
10772428 Therapy stool having an adjustable height and a tiltable seat Jamie Toland 2020-09-15
10610021 Chair supported by bellows with motion control Jamie Toland, Scott Fletcher 2020-04-07
9995328 Bracket combination for attaching a leg to an item of furniture 2018-06-12
9259756 Dispensing method and device for dispensing Jansen Harco, Ivar Schram 2016-02-16
7288739 Method of forming an opening or cavity in a substrate for receiving an electronic component 2007-10-30
6956182 Method of forming an opening or cavity in a substrate for receiving an electronic component 2005-10-18
6891219 Metal-insulator-metal capacitor formed by damascene processes between metal interconnect layers and method of forming same Derryl D. J. Allman 2005-05-10
6566268 Method and apparatus for planarizing a wafer surface of a semiconductor wafer having an elevated portion extending therefrom 2003-05-20
6541383 Apparatus and method for planarizing the surface of a semiconductor wafer Derryl D. J. Allman 2003-04-01
6528389 Substrate planarization with a chemical mechanical polishing stop layer Derryl D. J. Allman 2003-03-04
6524926 Metal-insulator-metal capacitor formed by damascene processes between metal interconnect layers and method of forming same Derryl D. J. Allman 2003-02-25
6451699 Method and apparatus for planarizing a wafer surface of a semiconductor wafer having an elevated portion extending therefrom 2002-09-17
6354908 Method and apparatus for detecting a planarized outer layer of a semiconductor wafer with a confocal optical system Derryl D. J. Allman, David W. Daniel 2002-03-12
6316276 Apparatus and method of planarizing a semiconductor wafer that includes a first reflective substance and a second reflective substance Derryl D. J. Allman 2001-11-13
6284586 Integrated circuit device and method of making the same using chemical mechanical polishing to remove material in two layers following masking John J. Seliskar, Derryl D. J. Allman, James P. Yakura, Dim-Lee Kwong 2001-09-04
6241847 Method and apparatus for detecting a polishing endpoint based upon infrared signals Derryl D. J. Allman, David W. Daniel 2001-06-05
6201253 Method and apparatus for detecting a planarized outer layer of a semiconductor wafer with a confocal optical system Derryl D. J. Allman, David W. Daniel 2001-03-13
6168502 Subsonic to supersonic and ultrasonic conditioning of a polishing pad in a chemical mechanical polishing apparatus Derryl D. J. Allman 2001-01-02
6121147 Apparatus and method of detecting a polishing endpoint layer of a semiconductor wafer which includes a metallic reporting substance David W. Daniel, Derryl D. J. Allman 2000-09-19
6115233 Integrated circuit device having a capacitor with the dielectric peripheral region being greater than the dielectric central region John J. Seliskar, Derryl D. J. Allman, James P. Yakura, Dim-Lee Kwong 2000-09-05
5868608 Subsonic to supersonic and ultrasonic conditioning of a polishing pad in a chemical mechanical polishing apparatus Derryl D. J. Allman 1999-02-09
5809436 Automatic throttle adjustor 1998-09-15
5559733 Memory with ferroelectric capacitor connectable to transistor gate Larry D. McMillan, Takashi Mihara, Hiroyuki Yoshimori, Carlos A. Paz de Araujo 1996-09-24
5523964 Ferroelectric non-volatile memory unit Larry D. McMillan, Takashi Mihara, Hiroyuki Yoshimori, Carlos A. Paz de Araujo 1996-06-04