Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11095675 | System and method for identifying system vulnerabilities | David Clark, Kevin J. Sullivan, Jane L M Kuberski, Paul J. Melko, Jr., Narayanasamy Balakrishnan +4 more | 2021-08-17 |
| 7095483 | Process independent alignment marks | James R. B. Elmer | 2006-08-22 |
| 6870160 | Method and apparatus for monitoring the condition of a lubricating medium | — | 2005-03-22 |
| 6856029 | Process independent alignment marks | James R. B. Elmer | 2005-02-15 |
| 6506684 | Anti-corrosion system | Dodd Defibaugh | 2003-01-14 |
| 6372520 | Sonic assisted strengthening of gate oxides | Kang-Jay Hsia, George H. Maggard | 2002-04-16 |
| 6354908 | Method and apparatus for detecting a planarized outer layer of a semiconductor wafer with a confocal optical system | Derryl D. J. Allman, John Gregory | 2002-03-12 |
| 6355532 | Subtractive oxidation method of fabricating a short-length and vertically-oriented channel, dual-gate, CMOS FET | John J. Seliskar, Verne Hornback | 2002-03-12 |
| 6316817 | MeV implantation to form vertically modulated N+ buried layer in an NPN bipolar transistor | John J. Seliskar, Todd A. Randazzo | 2001-11-13 |
| 6241847 | Method and apparatus for detecting a polishing endpoint based upon infrared signals | Derryl D. J. Allman, John Gregory | 2001-06-05 |
| 6235590 | Fabrication of differential gate oxide thicknesses on a single integrated circuit chip | Dianne G. Pinello, Michael F. Chisholm | 2001-05-22 |
| 6201253 | Method and apparatus for detecting a planarized outer layer of a semiconductor wafer with a confocal optical system | Derryl D. J. Allman, John Gregory | 2001-03-13 |
| 6121147 | Apparatus and method of detecting a polishing endpoint layer of a semiconductor wafer which includes a metallic reporting substance | John Gregory, Derryl D. J. Allman | 2000-09-19 |
| 6096625 | Method for improved gate oxide integrity on bulk silicon | Theodore Moore, Crystal J. Hass | 2000-08-01 |
| 6077783 | Method and apparatus for detecting a polishing endpoint based upon heat conducted through a semiconductor wafer | Derryl D. J. Allman, Michael F. Chisholm | 2000-06-20 |
| 6069048 | Reduction of silicon defect induced failures as a result of implants in CMOS and other integrated circuits | — | 2000-05-30 |
| 5966599 | Method for fabricating a low trigger voltage silicon controlled rectifier and thick field device | John D. Walker | 1999-10-12 |
| 5858828 | Use of MEV implantation to form vertically modulated N+ buried layer in an NPN bipolar transistor | John J. Seliskar, Todd A. Randazzo | 1999-01-12 |