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System and method for identifying system vulnerabilities |
David Clark, Kevin J. Sullivan, Jane L M Kuberski, Paul J. Melko, Jr., Narayanasamy Balakrishnan +4 more |
2021-08-17 |
| 7095483 |
Process independent alignment marks |
James R. B. Elmer |
2006-08-22 |
| 6870160 |
Method and apparatus for monitoring the condition of a lubricating medium |
— |
2005-03-22 |
| 6856029 |
Process independent alignment marks |
James R. B. Elmer |
2005-02-15 |
| 6506684 |
Anti-corrosion system |
Dodd Defibaugh |
2003-01-14 |
| 6372520 |
Sonic assisted strengthening of gate oxides |
Kang-Jay Hsia, George H. Maggard |
2002-04-16 |
| 6354908 |
Method and apparatus for detecting a planarized outer layer of a semiconductor wafer with a confocal optical system |
Derryl D. J. Allman, John Gregory |
2002-03-12 |
| 6355532 |
Subtractive oxidation method of fabricating a short-length and vertically-oriented channel, dual-gate, CMOS FET |
John J. Seliskar, Verne Hornback |
2002-03-12 |
| 6316817 |
MeV implantation to form vertically modulated N+ buried layer in an NPN bipolar transistor |
John J. Seliskar, Todd A. Randazzo |
2001-11-13 |
| 6241847 |
Method and apparatus for detecting a polishing endpoint based upon infrared signals |
Derryl D. J. Allman, John Gregory |
2001-06-05 |
| 6235590 |
Fabrication of differential gate oxide thicknesses on a single integrated circuit chip |
Dianne G. Pinello, Michael F. Chisholm |
2001-05-22 |
| 6201253 |
Method and apparatus for detecting a planarized outer layer of a semiconductor wafer with a confocal optical system |
Derryl D. J. Allman, John Gregory |
2001-03-13 |
| 6121147 |
Apparatus and method of detecting a polishing endpoint layer of a semiconductor wafer which includes a metallic reporting substance |
John Gregory, Derryl D. J. Allman |
2000-09-19 |
| 6096625 |
Method for improved gate oxide integrity on bulk silicon |
Theodore Moore, Crystal J. Hass |
2000-08-01 |
| 6077783 |
Method and apparatus for detecting a polishing endpoint based upon heat conducted through a semiconductor wafer |
Derryl D. J. Allman, Michael F. Chisholm |
2000-06-20 |
| 6069048 |
Reduction of silicon defect induced failures as a result of implants in CMOS and other integrated circuits |
— |
2000-05-30 |
| 5966599 |
Method for fabricating a low trigger voltage silicon controlled rectifier and thick field device |
John D. Walker |
1999-10-12 |
| 5858828 |
Use of MEV implantation to form vertically modulated N+ buried layer in an NPN bipolar transistor |
John J. Seliskar, Todd A. Randazzo |
1999-01-12 |
