Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8977917 | Highly secure and extensive scan testing of integrated circuits | Wei Han, Zheng Chen, Jie Qin, Shankar Durgamahanthi, Kanad Chakraborty +1 more | 2015-03-10 |
| 8368424 | Programmable logic device wakeup using a general purpose input/output port | Wei Han, Zheng Chen, Warren Juenemann | 2013-02-05 |
| 8319521 | Safe programming of key information into non-volatile memory for a programmable logic device | Wei Han, Barry Britton, Zheng Chen, Warren Juenemann, Mose Wahlstrom | 2012-11-27 |
| 6108806 | Method of testing and diagnosing field programmable gate arrays | Miron Abramovici, Charles E. Stroud | 2000-08-22 |