Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8977917 | Highly secure and extensive scan testing of integrated circuits | Wei Han, Zheng Chen, Eric Lee, Jie Qin, Kanad Chakraborty +1 more | 2015-03-10 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8977917 | Highly secure and extensive scan testing of integrated circuits | Wei Han, Zheng Chen, Eric Lee, Jie Qin, Kanad Chakraborty +1 more | 2015-03-10 |