| 7428683 |
Automatic analog test and compensation with built-in pattern generator and analyzer |
Fa Dai |
2008-09-23 |
| 7412343 |
Methods for delay-fault testing in field-programmable gate arrays |
Miron Abramovici |
2008-08-12 |
| 6973608 |
Fault tolerant operation of field programmable gate arrays |
Miron Abramovici, John M. Emmert |
2005-12-06 |
| 6966020 |
Identifying faulty programmable interconnect resources of field programmable gate arrays |
Miron Abramovici |
2005-11-15 |
| 6874108 |
Fault tolerant operation of reconfigurable devices utilizing an adjustable system clock |
Miron Abramovici, John M. Emmert |
2005-03-29 |
| 6631487 |
On-line testing of field programmable gate array resources |
Miron Abramovici |
2003-10-07 |
| 6574761 |
On-line testing of the programmable interconnect network in field programmable gate arrays |
Miron Abramovici |
2003-06-03 |
| 6550030 |
On-line testing of the programmable logic blocks in field programmable gate arrays |
Miron Abramovici |
2003-04-15 |
| 6530049 |
On-line fault tolerant operation via incremental reconfiguration of field programmable gate arrays |
Miron Abramovici, John M. Emmert |
2003-03-04 |
| 6256758 |
Fault tolerant operation of field programmable gate arrays |
Miron Abramovici |
2001-07-03 |
| 6202182 |
Method and apparatus for testing field programmable gate arrays |
Miron Abramovici, Sajitha Wijesuriya |
2001-03-13 |
| 6108806 |
Method of testing and diagnosing field programmable gate arrays |
Miron Abramovici, Eric Lee |
2000-08-22 |
| 6052808 |
Maintenance registers with Boundary Scan interface |
Shianling Wu, Ramesh Karri |
2000-04-18 |
| 6003150 |
Method for testing field programmable gate arrays |
Miron Abramovici |
1999-12-14 |
| 5991907 |
Method for testing field programmable gate arrays |
Miron Abramovici |
1999-11-23 |
| 5251208 |
Digital signal processor synchronous network |
Ronald J. Canniff, Philip Chao, Alan H. Matten |
1993-10-05 |
| 5230000 |
Built-in self-test (BIST) circuit |
Kenneth D. Mozingo |
1993-07-20 |
| 4872168 |
Integrated circuit with memory self-test |
Duane Rodney Aadsen, Sunil K. Jain |
1989-10-03 |