Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7428683 | Automatic analog test and compensation with built-in pattern generator and analyzer | Fa Dai | 2008-09-23 |
| 7412343 | Methods for delay-fault testing in field-programmable gate arrays | Miron Abramovici | 2008-08-12 |
| 6973608 | Fault tolerant operation of field programmable gate arrays | Miron Abramovici, John M. Emmert | 2005-12-06 |
| 6966020 | Identifying faulty programmable interconnect resources of field programmable gate arrays | Miron Abramovici | 2005-11-15 |
| 6874108 | Fault tolerant operation of reconfigurable devices utilizing an adjustable system clock | Miron Abramovici, John M. Emmert | 2005-03-29 |
| 6631487 | On-line testing of field programmable gate array resources | Miron Abramovici | 2003-10-07 |
| 6574761 | On-line testing of the programmable interconnect network in field programmable gate arrays | Miron Abramovici | 2003-06-03 |
| 6550030 | On-line testing of the programmable logic blocks in field programmable gate arrays | Miron Abramovici | 2003-04-15 |
| 6530049 | On-line fault tolerant operation via incremental reconfiguration of field programmable gate arrays | Miron Abramovici, John M. Emmert | 2003-03-04 |
| 6256758 | Fault tolerant operation of field programmable gate arrays | Miron Abramovici | 2001-07-03 |
| 6202182 | Method and apparatus for testing field programmable gate arrays | Miron Abramovici, Sajitha Wijesuriya | 2001-03-13 |
| 6108806 | Method of testing and diagnosing field programmable gate arrays | Miron Abramovici, Eric Lee | 2000-08-22 |
| 6052808 | Maintenance registers with Boundary Scan interface | Shianling Wu, Ramesh Karri | 2000-04-18 |
| 6003150 | Method for testing field programmable gate arrays | Miron Abramovici | 1999-12-14 |
| 5991907 | Method for testing field programmable gate arrays | Miron Abramovici | 1999-11-23 |
| 5251208 | Digital signal processor synchronous network | Ronald J. Canniff, Philip Chao, Alan H. Matten | 1993-10-05 |
| 5230000 | Built-in self-test (BIST) circuit | Kenneth D. Mozingo | 1993-07-20 |
| 4872168 | Integrated circuit with memory self-test | Duane Rodney Aadsen, Sunil K. Jain | 1989-10-03 |