Charles E. Stroud — 18 Patents at AT&T

Charles E. Stroud has been granted 18 US patents while listed as an inventor at AT&T. The first was granted in 1989 and the most recent in September 2008. Charles E. Stroud ranks #245,716 of 4,157,543 US inventors in our database (top 5.9%). Patent records list Charles E. Stroud in North Aurora, IL, US.

Issued Patents All Time

Showing 1–18 of 18 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
7428683	Automatic analog test and compensation with built-in pattern generator and analyzer	Fa Dai	2008-09-23
7412343	Methods for delay-fault testing in field-programmable gate arrays	Miron Abramovici	2008-08-12
6973608	Fault tolerant operation of field programmable gate arrays	Miron Abramovici, John M. Emmert	2005-12-06	$3,176,000
6966020	Identifying faulty programmable interconnect resources of field programmable gate arrays	Miron Abramovici	2005-11-15	$12,120,000
6874108	Fault tolerant operation of reconfigurable devices utilizing an adjustable system clock	Miron Abramovici, John M. Emmert	2005-03-29
6631487	On-line testing of field programmable gate array resources	Miron Abramovici	2003-10-07	$13,221,000
6574761	On-line testing of the programmable interconnect network in field programmable gate arrays	Miron Abramovici	2003-06-03	$15,861,000
6550030	On-line testing of the programmable logic blocks in field programmable gate arrays	Miron Abramovici	2003-04-15	$15,903,000
6530049	On-line fault tolerant operation via incremental reconfiguration of field programmable gate arrays	Miron Abramovici, John M. Emmert	2003-03-04	$13,349,000
6256758	Fault tolerant operation of field programmable gate arrays	Miron Abramovici	2001-07-03	$7,831,000
6202182	Method and apparatus for testing field programmable gate arrays	Miron Abramovici, Sajitha Wijesuriya	2001-03-13	$29,363,000
6108806	Method of testing and diagnosing field programmable gate arrays	Miron Abramovici, Eric Lee	2000-08-22	$36,547,000
6052808	Maintenance registers with Boundary Scan interface	Shianling Wu, Ramesh Karri	2000-04-18	$71,367,000
6003150	Method for testing field programmable gate arrays	Miron Abramovici	1999-12-14	$112,324,000
5991907	Method for testing field programmable gate arrays	Miron Abramovici	1999-11-23	$51,392,000
5251208	Digital signal processor synchronous network	Ronald J. Canniff, Philip Chao, Alan H. Matten	1993-10-05
5230000	Built-in self-test (BIST) circuit	Kenneth D. Mozingo	1993-07-20
4872168	Integrated circuit with memory self-test	Duane Rodney Aadsen, Sunil K. Jain	1989-10-03

Charles E. Stroud — 18 Patents

Issued Patents All Time

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