Hiroki MIYAI — 6 Patents at Lasertec

Hiroki MIYAI has been granted 6 US patents while listed as an inventor at Lasertec. The first was granted in 2017 and the most recent in November 2023. Hiroki MIYAI ranks #779,687 of 4,157,543 US inventors in our database (top 18.8%). Patent records list Hiroki MIYAI in Yokohama, JP.

Issued Patents All Time

Showing 1–6 of 6 patents

Patent #	Title	Co-Inventors	Date
11822233	Image pickup apparatus and focus adjustment method using bending correction to adjust focusing	Yoshito Fujiwara, Yoshihiro Kato	2023-11-21
10706527	Correction method, correction apparatus, and inspection apparatus	Tsunehito KOHYAMA, Haruhiko Kusunose, Kiwamu Takehisa, Itaru Matsugu	2020-07-07
10319088	Inspection apparatus of EUV mask and its focus adjustment method	Kiwamu Takehisa	2019-06-11
10156664	Mask inspection apparatus and mask inspection method	Kiwamu Takehisa	2018-12-18
9786057	Inspection apparatus, coordinate detection apparatus, coordinate detection method, and wavefront aberration correction method	Masafumi Shinoda	2017-10-10
9638739	Defect coordinates measurement device, defect coordinates measurement method, mask manufacturing method, and reference mask	Haruhiko Kusunose	2017-05-02

Hiroki MIYAI — 6 Patents

Issued Patents All Time

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