Issued Patents All Time
Showing 26–27 of 27 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5780859 | Electrostatic-magnetic lens arrangement | Hans-Peter Feuerbaum, Jürgen Frosien, Koshi Ueda, Gerald Schonecker | 1998-07-14 |
| 5640098 | IC fault analysis system having charged particle beam tester | Hironobu Niijima, Hiroshi Kawamoto, Akira Goishi, Masayuki Kurihara | 1997-06-17 |