Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5892779 | Scan test apparatus | Yasuji Ohyama, Mitsuaki Ishikawa, Tadashi Kamada | 1999-04-06 |
| 5825191 | IC fault location tracing apparatus and method | Hiroaki Kobayashi | 1998-10-20 |
| 5821761 | Apparatus detecting an IC defect by comparing electron emissions from two integrated circuits | Soichi Shida, Hiroshi Kawamoto | 1998-10-13 |
| 5757198 | Method and apparatus for detecting an IC defect using charged particle beam | Soichi Shida, Hiroshi Kawamoto | 1998-05-26 |
| 5640098 | IC fault analysis system having charged particle beam tester | Hiroshi Kawamoto, Akira Goishi, Masayuki Kurihara, Toshimichi Iwai | 1997-06-17 |
| 5592100 | Method for detecting an IC defect using charged particle beam | Soichi Shida, Hiroshi Kawamoto | 1997-01-07 |
| 5521517 | Method and apparatus for detecting an IC defect using a charged particle beam | Soichi Shida, Hiroshi Kawamoto | 1996-05-28 |
| 4835535 | Digital-to-analog converting apparatus equipped with calibrating function | Akinori Shibayama | 1989-05-30 |
| 4789945 | Method and apparatus for charged particle beam exposure | — | 1988-12-06 |