Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11372340 | Method and system for providing a quality metric for improved process control | Daniel Kandel, Guy M. Cohen, Dana Klein, Vladimir Levinski, Noam Sapiens +3 more | 2022-06-28 |
| 9909982 | Pupil plane calibration for scatterometry overlay measurement | Barak Bringoltz, Ofir Aharon, Guy Ben Dov, Zeev Bomzon | 2018-03-06 |