ST

Suryanarayana Tummala

KL Kla-Tencor: 2 patents #809 of 1,394Top 60%
Overall (All Time): #2,087,275 of 4,157,543Top 55%
2
Patents All Time

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
8135204 Computer-implemented methods, carrier media, and systems for creating a defect sample for use in selecting one or more parameters of an inspection recipe Chien-Huei Chen, Barry G. Becker, Hong Chen, Michael J. Van Riet, Chris Maher +2 more 2012-03-13
8000922 Methods and systems for generating information to be used for selecting values for one or more parameters of a detection algorithm Hong Chen, Michael J. Van Riet, Chien-Huei Chen, Jason Z. Lin, Chris Maher +4 more 2011-08-16