Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10571407 | Determining information for defects on wafers | Pavel Kolchin, Mikhail Haurylau, Robert M. Danen, David W. Shortt | 2020-02-25 |
| 10317347 | Determining information for defects on wafers | Pavel Kolchin, Mikhail Haurylau, Robert M. Danen, David W. Shortt | 2019-06-11 |
| 9696264 | Apparatus and methods for determining defect depths in vertical stack memory | Steven R. Lange, Robert M. Danen | 2017-07-04 |