Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4644172 | Electronic control of an automatic wafer inspection system | Paul Sandland, Kenneth L. Levy, Michael L. Hodgson, Gerald R. Cutler | 1987-02-17 |
| 4618938 | Method and apparatus for automatic wafer inspection | Paul Sandland, Curt H. Chadwick, Howard Dwyer | 1986-10-21 |
| 4196353 | Microradiographic microsphere manipulator | — | 1980-04-01 |