Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4644172 | Electronic control of an automatic wafer inspection system | Kenneth L. Levy, Russell M. Singleton, Michael L. Hodgson, Gerald R. Cutler | 1987-02-17 |
| 4618938 | Method and apparatus for automatic wafer inspection | Curt H. Chadwick, Russell M. Singleton, Howard Dwyer | 1986-10-21 |
| 4556317 | X-Y Stage for a patterned wafer automatic inspection system | Curt H. Chadwick, Howard Dwyer | 1985-12-03 |
| 4347001 | Automatic photomask inspection system and apparatus | Kenneth L. Levy | 1982-08-31 |
| 4334154 | Tomographic scanning apparatus | — | 1982-06-08 |
| 4247203 | Automatic photomask inspection system and apparatus | Kenneth L. Levy | 1981-01-27 |
| 4236079 | Tomographic scanning apparatus | — | 1980-11-25 |