Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4618938 | Method and apparatus for automatic wafer inspection | Paul Sandland, Curt H. Chadwick, Russell M. Singleton | 1986-10-21 |
| 4556317 | X-Y Stage for a patterned wafer automatic inspection system | Paul Sandland, Curt H. Chadwick | 1985-12-03 |