Issued Patents All Time
Showing 76–100 of 111 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7857083 | Excavation machine | Yasuyuki Oyamada, Keiichi Nishihara, Takafumi Nobayashi, Masao Nagata, Saizou Kondou +1 more | 2010-12-28 |
| D594883 | Power shovel | Saizou Kondou, Takafumi Nobayashi, Keiichi Nishihara, Masao Nagata | 2009-06-23 |
| 7496456 | 3D ultrasonographic device | Kazuo Hiyama, Motohisa Abe, Hirokazu Karasawa, Masahiro Katayama | 2009-02-24 |
| 7454066 | Extracting method of pattern contour, image processing method, searching method of pattern edge, scanning method of probe, manufacturing method of semiconductor device, pattern inspection apparatus, and program | — | 2008-11-18 |
| 7421900 | Ultrasonograph, ultrasonic transducer, examining instrument, and ultrasonographing device | Hirokazu Karasawa, Masayuki Nakamoto, Makoto Ochiai, Katsuyoshi Fukuda, Taiji Hirasawa | 2008-09-09 |
| 7418363 | Micropattern measuring method, micropattern measuring apparatus, and computer-readable recording medium on which a micropattern measuring program is recorded | Yumiko Miyano | 2008-08-26 |
| 7412671 | Apparatus and method for verifying an integrated circuit pattern | Takeshi Ito, Koji Hashimoto | 2008-08-12 |
| 7321680 | Graphic contour extracting method, pattern inspecting method, program and pattern inspecting system | Yumiko Miyano | 2008-01-22 |
| 7312908 | 3D image display and 3D image display method | Tamiki Takemori | 2007-12-25 |
| 7305116 | Extracting method of pattern contour, image processing method, searching method of pattern edge, scanning method of probe, manufacturing method of semiconductor device, pattern inspection apparatus, and program | — | 2007-12-04 |
| 7248349 | Exposure method for correcting a focal point, and a method for manufacturing a semiconductor device | Takashi Sato, Shoji Mimotogi, Soichi Inoue | 2007-07-24 |
| 7177480 | Graphic processing method and device | Koji Hashimoto, Takeshi Ito | 2007-02-13 |
| 7075098 | Method of selecting pattern to be measured, pattern inspection method, manufacturing method of semiconductor device, program, and pattern inspection apparatus | Daisuke Kawamura, Hisako Aoyama | 2006-07-11 |
| 7023587 | Image scanning apparatus, recording medium which stores image scanning programs, and data structure | — | 2006-04-04 |
| 6967719 | Method for inspecting exposure apparatus, exposure method for correcting focal point, and method for manufacturing semiconductor device | Takashi Sato, Shoji Mimotogi, Soichi Inoue | 2005-11-22 |
| 6963819 | Micropattern measuring method, micropattern measuring apparatus, and computer-readable recording medium on which a micropattern measuring program is recorded | Yumiko Miyano | 2005-11-08 |
| 6839470 | Pattern evaluation method, pattern evaluation system and computer readable recorded medium | — | 2005-01-04 |
| 6815677 | Scanning electron microscope and method of controlling the same | Kouichi Nagai | 2004-11-09 |
| 6772089 | Graphic contour extracting method, pattern inspecting method, program and pattern inspecting system | Yumiko Miyano | 2004-08-03 |
| 6642519 | Fine pattern inspection apparatus and method and managing apparatus and method of critical dimension scanning electron microscope device | — | 2003-11-04 |
| 6505195 | Classification of retrievable documents according to types of attribute elements | Kenji Satoh, Akitoshi Okumura | 2003-01-07 |
| 6327600 | Determining copyright information based on overlapping information between portions of two documents | Kenji Satoh, Akitoshi Okumura | 2001-12-04 |
| 6311322 | Program rewriting apparatus | Takuya Shirahata | 2001-10-30 |
| 6297874 | Film image reading device and a storage medium which stores a control procedure for the film image reading device | Eisaku Maeda, Tadashi Ohta, Takuya Shirahata | 2001-10-02 |
| 6243723 | Document classification apparatus | Akitoshi Okumura, Takayoshi Ochiai | 2001-06-05 |